• For R&D and high volume production of ferrite chip beads and chip inductors • Comparator and Contact Check
• |Z|, L, C, R testing
• 1MHz to 3GHz
• 0.5ms test speed, ±0.65% accuracy, 0.07% variability
• Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7580A
• For high volume production inspections and research and development • Comparator and contact check
• |Z|, L, C, R testing
• 1MHz to 300MHz
• 0.5ms test speed, ±0.72% accuracy
• Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7581
• For high volume production of ferrite chip beads and chip inductors • Comparator and contact check
• |Z|, L, C, R testing
• 100kHz to 300MHz
• 0.5ms test speed, ±0.72% accuracy
• Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7585
• For R&D and high volume production of ferrite chip beads and chip inductors • Comparator and Contact Check
• |Z|, L, C, R testing
• 1MHz to 1.3GHz
• 0.5ms test speed, ±0.65% accuracy, 0.07% variability
• Measure LCR and conduct frequency sweeps simultaneously
IMPEDANCE ANALYZER IM7583
• For high volume production of ferrite chip beads and chip inductors • Comprehensive contact check via DCR testing, Hi-Z reject or waveform judgment
• |Z|, L, C, R testing
• 1MHz to 600MHz • 0.5ms test speed, ±0.65% accuracy
• Measure LCR and conduct frequency sweeps simultaneously
CHEMICAL IMPEDANCE ANALYZER IM3590
• For R&D of electrochemical components & materials, batteries, & EDLCs • Measure ion behavior & solution resistance • LCR impedance testing for Cole-Cole plots & equivalent-circuit analyses
• |Z|, L, C, R, σ, ε testing
• Battery testing function
• 1 mHz to 200 kHz
• 2 ms test speed, ±0.05% accuracy
EQUIVALENT CIRCUIT ANALYSIS FIRMWARE IM9000
• Conduct simple circuit analysis & detailed acceptance/rejection decision-making for impedance analysis of advanced electrochemical components
• Optional software upgrade for Model IM3570
• 5 equivalent circuit models
• Compute ideal frequency characteristics and compare to measured values
• Cole-Cole plot, admittance circle display
IMPEDANCE ANALYZER IM3570
• Superior low-impedance repeatability • Meet applications in low-ESR measurement
• |Z|, L, C, R testing
• 4 Hz to 5 MHz
• 0.5 ms test speed, ±0.08% accuracy
• Single device solution for high speed testing and frequency sweeping
LCR Meters, up to 8 MHz
LCR METER IM3536
• Industry-standard LCR meter meeting the widest range of applications
• |Z|, L, C, R testing
• DC, or 4 Hz to 8 MHz (up to 10MHz special order available)
• 0.5 ms test speed, ±0.05% accuracy
• Accuracy guaranteed range from 1 mΩ
LCR METER IM3523
• Economical LCR Meter designed for production lines • Continuous testing over mixed measurement conditions, including C-D(120 Hz) and ESR(100 kHz) • Comparator and BIN functions
• |Z|, L, C, R testing
• 40 Hz to 200 kHz
• 2 ms test speed, ±0.05% accuracy
• Comparator and BIN functions
LCR METER IM3533
• Built-in low impedance high precision mode for testing low inductance or ESR of aluminum electrolysis capacitance • Turn ratio, mutual inductance and inductance difference measurements of transformers and coils
• |Z|, L, C, R testing
• 1 mHz to 200 kHz
• 2 ms test speed, ±0.05% accuracy
• Transformer measurement mode
LCR HiTESTER 3511-50
• Integrate into automated production lines • On-board testing of capacitors and coils
• |Z|, L, C, R testing
• 120 Hz or 1 kHz
• 5 ms test speed, ±0.08% accuracy
• High-speed comparator
Capacitance Meters, up to 1 MHz
C METER 3506-10
• High speed testing of ceramic capacitors on production lines • Integrate with automatic taping machines and sorters for production of MLCC (multi-layer ceramic capacitors)
• C, D, (tan δ), Q, low capacitance testing
• 1 kHz or 1 MHz
• 1.5 ms test speed (1MHz), ±0.14% accuracy
C HiTESTER 3504
• Capacitance testing with voltage dependency characteristics through the use of constant voltage testing (CV) • Detect contact failure on all 4 terminals for increased reliability • High speed inspection of Multi-Layer Ceramic Capacitors (MLCC) on taping machines
• C, D (tan δ), large capacitance MLCC testing
• 120Hz or 1kHz
• 2 ms test speed, ±0.09% accuracy
Test fixture or Probes
SMD TEST FIXTURE IM9201
• Test fixture for IM758X series Impedance Analyzers • High frequency analysis
• For direct connection two-wire testing
• DC to 3 GHz
• 6 measurable sample sizes: 0201 to 1210 (EIA)
SMD TEST FIXTURE IM9110
• High-precision two-wire fixture • High reproducibility with advanced contact technology
• For direct connection two-wire testing
• DC to 1 MHz
• Measurable sample size: 008004 (EIA)
SMD TEST FIXTURE IM9100
• High-precision 4-wire testing of advanced electronic components
• Direct-connection testing
• Test SMDs with electrodes on the bottom
• DC to 8MHz
• Measurable sample sizes: 01005 to 0402 (EIA)
PINCHER PROBE L2001
• 2-wire probe for LCR testing of small chip components